博客來The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions的圖書 |
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions 作者：Kumar 出版社：CRC Press 出版日期：2024-11-29 語言：英文 規格：平裝 / 130頁 / 普通級/ 初版 |
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圖書名稱：Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
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