This book describes both theory and practice of optical techniques to measure various parameters encountered routinely in science and engineering.
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Introduction to Optical Metrology 作者:Sirohi 出版社:CRC Press 出版日期:2025-09-25 語言:英文 規格:精裝 / 592頁 / 普通級/ 初版 |
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This book describes both theory and practice of optical techniques to measure various parameters encountered routinely in science and engineering.
Professor Rajpal Singh Sirohi served as Professor of Physics at IIT Madras for more than two decades, as well as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar to Rose-Hulman Institute of Technology, Terre Haute, USA, Chair Professor Tezpur University, Assam India, Faculty at Alabama A&M University, Huntsville, Alabama USA. Prof. Rajpal Singh Sirohi is now retired, and spends his time reading books on history of science and spends mornings and evenings with his grandchildren. Prof. Sirohi’s research areas are Optical Metrology, Optical Instrumentation, Laser Instrumentation, Holography and Speckle Phenomenon.
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